nervous system
• increased susceptibility to kainate-induced seizures: higher mortality rates and higher morbidity scores
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• 4-fold increase in number of AD/AV (anterodorsal nucleus and anteroventral nucleus in anterior thalamus (AT)) neurons exhibiting spontaneous action potential spikes
• reduced input resistance in AD/AV neurons
• normal resting membrane potential, rheobase and neuronal firing rate in AD/AV neurons
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• reduced input resistance in AD/AV (anterodorsal nucleus and anteroventral nucleus in anterior thalamus (AT)) neurons leading to increased synaptic activity
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• reduced asynchronous qEPSC decay time at C-T synapses
• increased asynchronous quantal EPSC (qEPSC) amplitude, higher frequency and accelerated kinetics at corticothalamic (C-T) synapses
• increased AMPA-type ionotropic glutamate receptor (AMPAR)-mediated miniature EPSC (mEPSC) amplitude in subset of AD/AV (anterodorsal nucleus and anteroventral nucleus in anterior thalamus (AT)) neurons
• normal mEPSC frequencies
• normal asynchronous qEPSC rise time at C-T synapses
• normal asynchronous qEPSC amplitude, frequency and kinetics at mammillothalamic (M-T) and
subiculum-thalamic (S-T) synapses
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• increased asynchronous quantal EPSC (qEPSC) amplitude and higher frequencies
• increased AMPA-type ionotropic glutamate receptor (AMPAR)-mediated spontaneous EPSC (sEPSC) amplitude and frequency in AD/AV (anterodorsal nucleus and anteroventral nucleus in anterior thalamus (AT)) neurons
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• reduced asynchronous quantal EPSC (qEPSC) decay time
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• increased AMPA-type ionotropic glutamate receptor (AMPAR)-mediated miniature EPSC (mEPSC) amplitude in subset of AD/AV (anterodorsal nucleus and anteroventral nucleus in anterior thalamus (AT)) neurons
• normal mEPSC frequencies
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behavior/neurological
• lower novel object recognition index during test phase
• normal behavior in rotarod and elevated zero maze tests and normal grip strength and gait
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• increased susceptibility to kainate-induced seizures: higher mortality rates and higher morbidity scores
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• lower novel object recognition index during test phase
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